An analytical approach for determining strain ellipsoids from measurements on planar surfaces

GIG OpenIR > 中科院广州地化所(-2008)

	Shan YH
	An analytical approach for determining strain ellipsoids from measurements on planar surfaces
Source Publication	Journal of Structural Geology
ISSN	0191-8141
	2008
Volume	30 Issue:4 Pages:539-546
Language	英语
WOS ID	WOS:000255696700011
Indexed By	sci
Citation statistics	Cited Times:9[WOS] [WOS Record] [Related Records in WOS]
Document Type	期刊论文
Identifier	http://ir.gig.ac.cn/handle/344008/13897
Collection	中科院广州地化所(-2008)
Recommended Citation GB/T 7714	Shan YH. An analytical approach for determining strain ellipsoids from measurements on planar surfaces[J]. Journal of Structural Geology,2008,30(4):539-546.
APA	Shan YH.(2008).An analytical approach for determining strain ellipsoids from measurements on planar surfaces.Journal of Structural Geology,30(4),539-546.
MLA	Shan YH."An analytical approach for determining strain ellipsoids from measurements on planar surfaces".Journal of Structural Geology 30.4(2008):539-546.

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