GIG OpenIR  > 中科院广州地化所(-2008)
Shan YH
An analytical approach for determining strain ellipsoids from measurements on planar surfaces
Source PublicationJournal of Structural Geology
ISSN0191-8141
2008
Volume30Issue:4Pages:539-546
Indexed Bysci
Language英语
WOS IDWOS:000255696700011
Citation statistics
Cited Times:8[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.gig.ac.cn/handle/344008/13897
Collection中科院广州地化所(-2008)
Recommended Citation
GB/T 7714
Shan YH. An analytical approach for determining strain ellipsoids from measurements on planar surfaces[J]. Journal of Structural Geology,2008,30(4):539-546.
APA Shan YH.(2008).An analytical approach for determining strain ellipsoids from measurements on planar surfaces.Journal of Structural Geology,30(4),539-546.
MLA Shan YH."An analytical approach for determining strain ellipsoids from measurements on planar surfaces".Journal of Structural Geology 30.4(2008):539-546.
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