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Wei Gangjian; Wei Jingxian; Liu Ying; Ke Ting; Ren Zhongyuan; Ma Jinlong; Xu Yigang
Measurement on high-precision boron isotope of silicate materials by a single column purification method and MC-ICP-MS
Source PublicationJournal of Analytical Atomic Spectrometry
ISSN0267-9477
2013
Volume28Issue:4Pages:606-612
Indexed BySCI
Language英语
Document Type期刊论文
Identifierhttp://ir.gig.ac.cn/handle/344008/19037
Collection中国科学院广州地球化学研究所
Recommended Citation
GB/T 7714
Wei Gangjian,Wei Jingxian,Liu Ying,et al. Measurement on high-precision boron isotope of silicate materials by a single column purification method and MC-ICP-MS[J]. Journal of Analytical Atomic Spectrometry,2013,28(4):606-612.
APA Wei Gangjian.,Wei Jingxian.,Liu Ying.,Ke Ting.,Ren Zhongyuan.,...&Xu Yigang.(2013).Measurement on high-precision boron isotope of silicate materials by a single column purification method and MC-ICP-MS.Journal of Analytical Atomic Spectrometry,28(4),606-612.
MLA Wei Gangjian,et al."Measurement on high-precision boron isotope of silicate materials by a single column purification method and MC-ICP-MS".Journal of Analytical Atomic Spectrometry 28.4(2013):606-612.
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