Measurement on high-precision boron isotope of silicate materials by a single column purification method and MC-ICP-MS

GIG OpenIR

	Wei Gangjian; Wei Jingxian; Liu Ying; Ke Ting; Ren Zhongyuan; Ma Jinlong; Xu Yigang
	Measurement on high-precision boron isotope of silicate materials by a single column purification method and MC-ICP-MS
Source Publication	Journal of Analytical Atomic Spectrometry
ISSN	0267-9477
	2013
Volume	28 Issue:4 Pages:606-612
Language	英语
Indexed By	SCI
Document Type	期刊论文
Identifier	http://ir.gig.ac.cn/handle/344008/19037
Collection	中国科学院广州地球化学研究所
Recommended Citation GB/T 7714	Wei Gangjian,Wei Jingxian,Liu Ying,et al. Measurement on high-precision boron isotope of silicate materials by a single column purification method and MC-ICP-MS[J]. Journal of Analytical Atomic Spectrometry,2013,28(4):606-612.
APA	Wei Gangjian.,Wei Jingxian.,Liu Ying.,Ke Ting.,Ren Zhongyuan.,...&Xu Yigang.(2013).Measurement on high-precision boron isotope of silicate materials by a single column purification method and MC-ICP-MS.Journal of Analytical Atomic Spectrometry,28(4),606-612.
MLA	Wei Gangjian,et al."Measurement on high-precision boron isotope of silicate materials by a single column purification method and MC-ICP-MS".Journal of Analytical Atomic Spectrometry 28.4(2013):606-612.

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