Knowledge Management System Of Guangzhou Institute of Geochemistry，CAS
| B.H.W.S.de Jong | |
| Characterizing the surface chemistry of oxides with X-ray photoelectron sepctroscopy: Comparison of oxygen valence charge in octahedrally and tetrahedrally O coordinated metal ions and acid-base properties | |
| Source Publication | 地球化学
 |
| ISSN | 0379-1726 |
| 2010 | |
| Volume | 39Issue:3Pages:280-295 |
| Language | 英语 |
| Indexed By | CSCD |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.gig.ac.cn/handle/344008/16043 |
| Collection | 中国科学院广州地球化学研究所 |
| Recommended Citation GB/T 7714 | B.H.W.S.de Jong. Characterizing the surface chemistry of oxides with X-ray photoelectron sepctroscopy: Comparison of oxygen valence charge in octahedrally and tetrahedrally O coordinated metal ions and acid-base properties[J]. 地球化学,2010,39(3):280-295. |
| APA | B.H.W.S.de Jong.(2010).Characterizing the surface chemistry of oxides with X-ray photoelectron sepctroscopy: Comparison of oxygen valence charge in octahedrally and tetrahedrally O coordinated metal ions and acid-base properties.地球化学,39(3),280-295. |
| MLA | B.H.W.S.de Jong."Characterizing the surface chemistry of oxides with X-ray photoelectron sepctroscopy: Comparison of oxygen valence charge in octahedrally and tetrahedrally O coordinated metal ions and acid-base properties".地球化学 39.3(2010):280-295. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| z10072.pdf（3131KB） | 开放获取 | -- | View Application Full Text | |||
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