GIG OpenIR
Gao, Wei; Huang, Zhengxu; Nian, Huiqing; Shen, Xuejing; Wang, Peng; Hu, Shaocheng; Li, Mei; Cheng, Ping; Dong, Junguo; Xu, Xin; Zhou, Zhen
A novel gas analysis system for metallurgical materials based on time-of-flight mass spectrometry
Source PublicationInternational Journal of Mass Spectrometry
ISSN1387-3806
2010
Volume294Issue:2-3Pages:77-82
Language英语
WOS IDWOS:000280459100003
Indexed Bysci
Citation statistics
Cited Times:13[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.gig.ac.cn/handle/344008/15295
Collection中国科学院广州地球化学研究所
Recommended Citation
GB/T 7714
Gao, Wei,Huang, Zhengxu,Nian, Huiqing,et al. A novel gas analysis system for metallurgical materials based on time-of-flight mass spectrometry[J]. International Journal of Mass Spectrometry,2010,294(2-3):77-82.
APA Gao, Wei.,Huang, Zhengxu.,Nian, Huiqing.,Shen, Xuejing.,Wang, Peng.,...&Zhou, Zhen.(2010).A novel gas analysis system for metallurgical materials based on time-of-flight mass spectrometry.International Journal of Mass Spectrometry,294(2-3),77-82.
MLA Gao, Wei,et al."A novel gas analysis system for metallurgical materials based on time-of-flight mass spectrometry".International Journal of Mass Spectrometry 294.2-3(2010):77-82.
Files in This Item:
File Name/Size DocType Version Access License
2010038.pdf(373KB) 开放获取--View Application Full Text
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Gao, Wei]'s Articles
[Huang, Zhengxu]'s Articles
[Nian, Huiqing]'s Articles
Baidu academic
Similar articles in Baidu academic
[Gao, Wei]'s Articles
[Huang, Zhengxu]'s Articles
[Nian, Huiqing]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Gao, Wei]'s Articles
[Huang, Zhengxu]'s Articles
[Nian, Huiqing]'s Articles
Terms of Use
No data!
Social Bookmark/Share
File name: 2010038.pdf
Format: Adobe PDF
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.